JPH0575062B2 - - Google Patents

Info

Publication number
JPH0575062B2
JPH0575062B2 JP60244747A JP24474785A JPH0575062B2 JP H0575062 B2 JPH0575062 B2 JP H0575062B2 JP 60244747 A JP60244747 A JP 60244747A JP 24474785 A JP24474785 A JP 24474785A JP H0575062 B2 JPH0575062 B2 JP H0575062B2
Authority
JP
Japan
Prior art keywords
lead frame
image
light
defects
defect
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP60244747A
Other languages
English (en)
Japanese (ja)
Other versions
JPS62103548A (ja
Inventor
Kazuo Watanabe
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Dai Nippon Printing Co Ltd
Original Assignee
Dai Nippon Printing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dai Nippon Printing Co Ltd filed Critical Dai Nippon Printing Co Ltd
Priority to JP24474785A priority Critical patent/JPS62103548A/ja
Publication of JPS62103548A publication Critical patent/JPS62103548A/ja
Publication of JPH0575062B2 publication Critical patent/JPH0575062B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP24474785A 1985-10-31 1985-10-31 リ−ドフレ−ムの欠陥検査装置 Granted JPS62103548A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP24474785A JPS62103548A (ja) 1985-10-31 1985-10-31 リ−ドフレ−ムの欠陥検査装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP24474785A JPS62103548A (ja) 1985-10-31 1985-10-31 リ−ドフレ−ムの欠陥検査装置

Publications (2)

Publication Number Publication Date
JPS62103548A JPS62103548A (ja) 1987-05-14
JPH0575062B2 true JPH0575062B2 (en]) 1993-10-19

Family

ID=17123290

Family Applications (1)

Application Number Title Priority Date Filing Date
JP24474785A Granted JPS62103548A (ja) 1985-10-31 1985-10-31 リ−ドフレ−ムの欠陥検査装置

Country Status (1)

Country Link
JP (1) JPS62103548A (en])

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01237439A (ja) * 1988-03-17 1989-09-21 Toshiba Corp 薄板パターン製品の外観検査装置
JPH0369238U (en]) * 1989-11-10 1991-07-09
JPH0434345A (ja) * 1990-05-30 1992-02-05 Dainippon Screen Mfg Co Ltd プリント基板検査装置のためのイメージ読取りシステム
JPH0776757B2 (ja) * 1990-12-14 1995-08-16 インターナショナル・ビジネス・マシーンズ・コーポレイション 光学的検査装置
IL131284A (en) 1999-08-05 2003-05-29 Orbotech Ltd Illumination for inspecting surfaces of articles
JP4712284B2 (ja) * 2000-04-10 2011-06-29 シーシーエス株式会社 表面検査装置
JP3472750B2 (ja) * 2000-04-10 2003-12-02 シーシーエス株式会社 表面検査装置
KR20010099035A (ko) * 2001-08-14 2001-11-09 - 리드프레임의 도금 및 외관검사방법
JP4038077B2 (ja) * 2002-06-05 2008-01-23 株式会社日立情報制御ソリューションズ 透明容器内注入液中の異物検出装置
JP4708904B2 (ja) * 2005-08-05 2011-06-22 株式会社名南製作所 木材の検査方法及び装置及びプログラム
KR100692573B1 (ko) 2005-08-31 2007-03-13 삼성전자주식회사 화상형성기기의 급지장치
JP5152818B2 (ja) * 2006-10-12 2013-02-27 レーザーテック株式会社 異物検査方法及びその異物検査方法を用いた異物検査装置
JP2010210373A (ja) * 2009-03-10 2010-09-24 Kyushu Nogeden:Kk 外観検査装置
CN105784714B (zh) * 2016-03-31 2018-05-29 浙江工业大学 一种通过鱼眼透镜组检测货架横梁是否合格的装置

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50129285A (en]) * 1974-04-01 1975-10-13
JPS5495290U (en]) * 1977-12-17 1979-07-05

Also Published As

Publication number Publication date
JPS62103548A (ja) 1987-05-14

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Legal Events

Date Code Title Description
EXPY Cancellation because of completion of term